According to a report by Fast Technology on December 1, a patent titled "Testing Method, System, Device, Electronic Device, and Storage Medium for Chip Pins" applied by Beijing Xiaomi Mobile Software Co., Ltd. was published on the official website of the National Intellectual Property Administration recently. The publication number is CN119044819A, with an application date of May 2023.

This patent relates to the field of chip testing technology. The patent abstract indicates that the current pin test type is determined, and the levels of the positive power supply pin, negative power supply pin, and the pin under test in the chip to be tested are configured to the test levels corresponding to the pin test type, respectively. The first level on the pin under test is then read.

Based on the comparison results between the test levels and the first level, as well as the pin test type, it is determined whether there is an anomaly on the pin under test.

This allows for accurate open and short circuit testing of the pin under test, assessing whether there are any anomalies in the connectivity of the pin under test, with high testing efficiency, low cost, and high stability.

Open and short circuit testing refers to the process of checking for open or short circuits between circuit boards or chip pins in electrical testing, according to the introduction.

Currently, open and short circuit testing has become an indispensable process step in semiconductor production.

In related technologies, large logic testers are commonly used to complete chip open and short circuit testing through computer upper computers. This method is not only costly but sometimes the equipment cannot support testing for shorts between pins on the test chip.